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  • Using synchrotron radiation x-ray multiple diffraction to examine the lattice coherency of semiconductor surfaces and epitaxial layers Sasaki JM, Cardoso LP, Campos C, Roberts KJ, Clark GF, Pantos E, Sacilotti MA JOURNAL OF APPLIED PHYSICS 79 (7): 3492-3498 APR 1 1996 ( PDF file )

  • INCOHERENCE, QUANTUM FLUCTUATIONS, AND NOISE SENITZKY IR PHYSICAL REVIEW 128 (6): 2864-& 1962 ( PDF file )

  • Coherence-incoherence and dimensional crossover in layered strongly correlated metals Valla T, Johnson PD, Yusof Z, Wells B, Li Q, Loureiro SM, Cava RJ, Mikami M, Mori Y, Yoshimura M, Sasaki T NATURE 417 (6889): 627-630 JUN 6 2002 ( PDF file )

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  • DETERMINATION OF INTERFACE COHERENCY BY X-RAY DOUBLE-CRYSTAL DIFFRACTION ZHU NC, LI RS, CHEN JY, XU SS JOURNAL OF APPLIED PHYSICS 75 (6): 2805-2808 MAR 15 1994 ( PDF file )

  • Decoherence in nanostructures and quantum systems O'Connell RF PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES 19 (1-2): 77-82 JUL 2003 ( PDF file )

  • Propagation of waves in layered structures viewed as number recognition S.V. Gaponenko, S.V. Zhukovsky, A.V. Lavrinenko, K.S. Sandomirskii Optics Communications 205, 49-57 (2002) ( PDF file )

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